Items where Author is "<span class="person_name">Tenentes, Vasileios</span>"
Number of items: 7.
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs. (2018)
Vasileios Tenentes,
Daniele Rossi,
Saqib Khursheed,
Bashir M. Al-Hashimi
and
Krishnendu Chakrabarty
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Exploiting Aging Benefits for the Design of Reliable Drowsy Cache Memories. (2017)
Daniele Rossi,
Vasileios Tenentes,
Sudhakar M. Reddy,
Bashir M. Al-Hashimi
and
Andrew Brown
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Susceptible Workload Evaluation and Protection using Selective Fault Tolerance. (2017)
Mauricio D. Gutierrez,
Vasileios Tenentes,
Daniele Rossi
and
Tom J. Kazmierski
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Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure. (2017)
Vasileios Tenentes,
Daniele Rossi,
Sheng Yang,
Saqib Khursheed,
Bashir M. Al-Hashimi
and
Steve R. Gunn
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The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology. (2016)
Basel Halak,
Vasileios Tenentes
and
Daniele Rossi
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Aging Benefits in Nanometer CMOS Designs. (2016)
Daniele Rossi,
Vasileios Tenentes,
Sheng Yang,
Saqib Khursheed
and
Bashir M. Al-Hashimi
![]()
Reliable Power Gating With NBTI Aging Benefits. (2016)
Daniele Rossi,
Vasileios Tenentes,
Sheng Yang,
Saqib Khursheed
and
Bashir M. Al-Hashimi
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